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HIGH · 7.8

CVE-2024-45573

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Vulnerability Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

CVSS Score

7.8

HIGH

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Attack Vector
LOCAL
Attack Complexity
LOW
Privileges Required
LOW
User Interaction
NONE
Scope
UNCHANGED
Confidentiality
HIGH
Integrity
HIGH
Availability
HIGH

Affected Products

VendorProductVersions
QualcommFastconnect 6700 Firmware-
QualcommFastconnect 6700-
QualcommFastconnect 6900 Firmware-
QualcommFastconnect 6900-
QualcommFastconnect 7800 Firmware-
QualcommFastconnect 7800-
QualcommQcm5430 Firmware-
QualcommQcm5430-
QualcommQcm6490 Firmware-
QualcommQcm6490-
QualcommQcs5430 Firmware-
QualcommQcs5430-
QualcommQcs6490 Firmware-
QualcommQcs6490-
QualcommVideo Collaboration Vc3 Platform Firmware-
QualcommVideo Collaboration Vc3 Platform-
QualcommSc8380Xp Firmware-
QualcommSc8380Xp-
QualcommSdm429W Firmware-
QualcommSdm429W-

Related Weaknesses (CWE)

CWE-823CWE-119

References

FAQ

What is CVE-2024-45573?

CVE-2024-45573 is a vulnerability with a CVSS score of 7.8 (HIGH). Memory corruption may occour while generating test pattern due to negative indexing of display ID.

How severe is CVE-2024-45573?

CVE-2024-45573 has been rated HIGH with a CVSS base score of 7.8/10. Review the CVSS metrics above for detailed severity breakdown.

Is there a patch for CVE-2024-45573?

Check the references section above for vendor advisories and patch information. Affected products include: Qualcomm Fastconnect 6700 Firmware, Qualcomm Fastconnect 6700, Qualcomm Fastconnect 6900 Firmware, Qualcomm Fastconnect 6900, Qualcomm Fastconnect 7800 Firmware.