CVE-2024-53017 — MEDIUM (6.6)

Vulnerability Description

Memory corruption while handling test pattern generator IOCTL command.

CVSS Score

6.6

MEDIUM

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Attack Vector

LOCAL

Attack Complexity

LOW

Privileges Required

LOW

User Interaction

NONE

Scope

UNCHANGED

Confidentiality

LOW

Integrity

HIGH

Availability

LOW

Affected Products

Vendor	Product	Versions
Qualcomm	Sdm429W Firmware	-
Qualcomm	Sdm429W	-
Qualcomm	Snapdragon 429 Mobile Platform Firmware	-
Qualcomm	Snapdragon 429 Mobile Platform	-
Qualcomm	Wcn3620 Firmware	-
Qualcomm	Wcn3620	-
Qualcomm	Wcn3660B Firmware	-
Qualcomm	Wcn3660B	-

Related Weaknesses (CWE)

CWE-823

References

https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulVendor Advisory

FAQ

What is CVE-2024-53017?

CVE-2024-53017 is a vulnerability with a CVSS score of 6.6 (MEDIUM). Memory corruption while handling test pattern generator IOCTL command.

How severe is CVE-2024-53017?

CVE-2024-53017 has been rated MEDIUM with a CVSS base score of 6.6/10. Review the CVSS metrics above for detailed severity breakdown.

Is there a patch for CVE-2024-53017?

Check the references section above for vendor advisories and patch information. Affected products include: Qualcomm Sdm429W Firmware, Qualcomm Sdm429W, Qualcomm Snapdragon 429 Mobile Platform Firmware, Qualcomm Snapdragon 429 Mobile Platform, Qualcomm Wcn3620 Firmware.