Description
The product does not adequately protect confidential information on the device from being accessed by Outsourced Semiconductor Assembly and Test (OSAT) vendors.
In contrast to complete vertical integration of architecting, designing, manufacturing, assembling, and testing chips all within a single organization, an organization can choose to simply architect and design a chip before outsourcing the rest of the process to OSAT entities (e.g., external foundries and test houses). In the latter example, the device enters an OSAT facility in a much more vulnerable pre-production stage where many debug and test modes are accessible. Therefore, the chipmaker must place a certain level of trust with the OSAT. To counter this, the chipmaker often requires the OSAT partner to enter into restrictive non-disclosure agreements (NDAs). Nonetheless, OSAT vendors likely have many customers, which increases the risk of accidental sharing of information. There may also be a security vulnerability in the information technology (IT) system of the OSAT facility. Alternatively, a malicious insider at the OSAT facility may carry out an insider attack. Considering these factors, it behooves the chipmaker to minimize any confidential information in the device that may be accessible to the OSAT vendor. Logic errors during design or synthesis could misconfigure the interconnection of the debug components, which could provide improper authorization to sensitive information.
Potential Impact
Confidentiality, Integrity, Access Control, Authentication, Authorization, Availability, Accountability, Non-Repudiation
Gain Privileges or Assume Identity, Bypass Protection Mechanism, Execute Unauthorized Code or Commands, Modify Memory, Modify Files or Directories
Demonstrative Examples
Mitigations & Prevention
Detection Methods
- Architecture or Design Review High — Appropriate Post-Si tests should be carried out to ensure that residual confidential information is not left on parts leaving one facility for another facility.
- Dynamic Analysis with Manual Results Interpretation Moderate — Appropriate Post-Si tests should be carried out to ensure that residual confidential information is not left on parts leaving one facility for another facility.
Related Weaknesses
Frequently Asked Questions
What is CWE-1297?
CWE-1297 (Unprotected Confidential Information on Device is Accessible by OSAT Vendors) is a software weakness identified by MITRE's Common Weakness Enumeration. It is classified as a Base-level weakness. The product does not adequately protect confidential information on the device from being accessed by Outsourced Semiconductor Assembly and Test (OSAT) vendors.
How can CWE-1297 be exploited?
Attackers can exploit CWE-1297 (Unprotected Confidential Information on Device is Accessible by OSAT Vendors) to gain privileges or assume identity, bypass protection mechanism, execute unauthorized code or commands, modify memory, modify files or directories. This weakness is typically introduced during the Implementation phase of software development.
How do I prevent CWE-1297?
Key mitigations include:
What is the severity of CWE-1297?
CWE-1297 is classified as a Base-level weakness (Medium abstraction). Its actual severity depends on the specific context and how the weakness manifests in your application.